The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Oct. 01, 2021
Duke University, Durham, NC (US);
Krishnendu Chakrabarty, Durham, NC (US);
Arjun Chaudhuri, Durham, NC (US);
DUKE UNIVERSITY, Durham, NC (US);
Abstract
A method of fault criticality assessment using neural twins includes converting a netlist into a neural twin by replacing each circuit element of the netlist with a neural-network-readable cell equivalent; and replacing each wire with a neural connection. Bias value adders are inserted at locations in the neural twin; and these bias value adders are used to apply a bias that represents a perturbation in the signal propagated by that connection. For each perturbed bias at a corresponding site selected to be perturbed, a loss value is calculated for the neural twin; and the site is classified, using a neural-twin-trained classifier, as critical or benign based on that loss value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile