The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

May. 03, 2024
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Srinath Madasu, Houston, TX (US);

William Chang, Burlingame, CA (US);

Jean Pommier, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/35 (2025.01);
U.S. Cl.
CPC ...
G06F 16/35 (2019.01);
Abstract

A method that includes receiving information system tickets, generating for each information system ticket a first state of data to capture an original state of one or more end-user operational data, generating for each information system ticket a second state of data to capture a changed state of the one or more end-user operational data, storing the first state and the second state in a database, and mining the database for changes in end-user operational data between the first state and the second state to generate patterns of changes. The patterns of changes are clustered into a number of clusters with each cluster representing a different ticketing issue.


Find Patent Forward Citations

Madasu, Srinath. (2026). Fallout evaluation in an information system (U.S. Patent No. 12769779). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769779

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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