The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Dec. 14, 2024
International Business Machines Corporation, Armonk, NY (US);
Dominic Rossillo, Highland, NY (US);
Michael Terrence Cohoon, Fishkill, NY (US);
James A O'connor, Ulster Park, NY (US);
Steven Lafalce, Salt Point, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A search is conducted to identify database defect reports describing similar defects to a proposed defect description. The proposed defect description is analyzed to determine whether the proposed defect description includes an amount of information sufficient to describe a corresponding problem based on historical defect data. A synthetic updated defect description is generated based on the latest updated defect description or the proposed defect description in response to the latest updated defect description or the proposed defect description not including a sufficient amount of information. An evaluation to identify high-level content differences between the synthetic updated defect description and one of the latest updated defect description and the proposed defect description is performed. Prompts describing suggestions of additional information to provide in the final defect report are generated based on the high-level content differences. A user is prompted to update the proposed defect description or the latest updated defect description.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile