The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Dec. 11, 2024
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Zijia Wang, London, GB;

Min Gong, Shanghai, CN;

Mustafa Albado, Cork, IE;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3072 (2013.01); G06F 11/3034 (2013.01); G06F 11/3051 (2013.01); G06F 11/323 (2013.01);
Abstract

Methods, system, and non-transitory processor-readable storage medium for higher-level service health are provided herein. An example method includes transforming, by a monitoring system, time series data into graph representations. The monitoring system extracts graph features from the graph representations. The monitoring system computes a hybrid distance metric by combining Sum of Squared Distances (SSD) and Fréchet Distance and generates a similarity score based on the hybrid distance metric, where the similarity score evaluates time series data similarity in performance measurements.


Find Patent Forward Citations

Wang, Zijia. (2026). Geometric-aware distance measure for performance testing analysis (U.S. Patent No. 12769632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769632

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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