The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Mar. 08, 2024
Nec Laboratories America, Inc., Princeton, NJ (US);
Yuncong Chen, Jersey City, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Luan Tang, Cranbury, NJ (US);
Zhengzhang Chen, Princeton Junction, NJ (US);
NEC Corporation, , JP;
Abstract
Methods and systems for anomaly detection include encoding a time series with a time series encoder and encoding an event sequence with an event sequence encoder. A latent code is generated from outputs of the time series encoder and the event sequence encoder. The time series is reconstructed from the latent code using a time series decoder. The event sequence is reconstructed from the latent code using an event sequence decoder. An anomaly score is determined based on a reconstruction loss of the reconstructed time series and a reconstruction loss of the reconstructed event sequence. An action is performed responsive to the anomaly score.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile