The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Feb. 17, 2025
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Zifeng Wang, Los Angeles, CA (US);

Vincent Perot, Brooklyn, NY (US);

Long Thanh Le, Sunnyvale, CA (US);

Jin Miao, San Jose, CA (US);

Zizhao Zhang, Santa Clara, CA (US);

Chen-Yu Lee, Cupertino, CA (US);

Tomas Jon Pfister, Redwood City, CA (US);

Chun-Liang Li, Santa Clara, CA (US);

Assignee:

GOOGLE LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 9/30192 (2013.01); G06N 20/00 (2019.01);
Abstract

Aspects of the disclosed technology include computer-implemented systems and methods for adapting machine-learned models using high-quality synthetic data that is tailored to elicit improved instruction-following abilities for particular target instruction distributions and models. A model adaptation system can obtain instruction metadata indicative of at least one use case and at least one skill associated with a particular computing task to be performed by a target machine-learned model. The system can generate a metadata-conditioned synthetic instruction by prompting a generative model system including one or more machine-learned generative models with the instruction metadata as one or more constraints. The system can generate a model response by prompting the generative model system with the metadata-conditioned synthetic instruction. The system can modify a target sequence processing model based at least in part on a data pair including the metadata-conditioned synthetic instruction and the model response.


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Wang, Zifeng. (2026). Machine-learned model alignment with synthetic data (U.S. Patent No. 12769552). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769552

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