The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jul. 11, 2022
Applicant:

Raytheon Technologies Corporation, Farmington, CT (US);

Inventors:

Nigel D. Sawyers-Abbott, South Glastonbury, CT (US);

Uyen Phan, Arcadia, CA (US);

Garrett Kernozicky, Mansfield, CT (US);

Assignee:

RTX CORPORATION, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); F01D 5/00 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0283 (2013.01); F01D 5/005 (2013.01);
Abstract

A method can comprise: receiving, via a processor, scanner data from an inspection system for a bladed rotor, the scanner data including a point cloud defining an inspected bladed rotor, the scanner data including a first data size; generating, via the processor, a data set including section files spaced apart along a span of a blade based on the point cloud; determining, via the processor, a defect on the blade of the inspected bladed rotor based on the data set; and determining whether the defect meets serviceable limits.


Find Patent Forward Citations

Sawyers-Abbott, Nigel. (2026). Inspection data management systems and methods (U.S. Patent No. 12769300). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769300

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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