The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 16, 2021
Applicant:

Instrument Systems Gmbh, Munich, DE;

Inventors:

Frank Münchow, Munich, DE;

Stephanie Grabher, Munich, DE;

Martin Finger, Bockhorn, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G02B 21/18 (2006.01); G02B 27/10 (2006.01); G02B 27/28 (2006.01); G01J 1/00 (2006.01); G01J 3/02 (2006.01); G02B 21/00 (2006.01); H01S 3/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/18 (2013.01); G02B 27/106 (2013.01); G02B 27/288 (2013.01); G01J 1/00 (2013.01); G01J 1/4257 (2013.01); G01J 3/0218 (2013.01); G02B 21/0096 (2013.01); H01S 3/0014 (2013.01);
Abstract

The present disclosure relates to a measuring system for measuring a light source in a polarization-independent manner, having a camera comprising a plurality of image sensors arranged in the form of a matrix, and a microscope optics, and to a method for measuring the light sources in a polarization-independent manner. The aim is to make it possible to measure the light output of the light source in an improved, simple and largely polarization-independent manner while maintaining the spatial resolution in the microscopic range. To that end, the present disclosure proposes that a linear polarizer is associated with each of the image sensors, wherein the linear polarizers are arranged in the form of a matrix in front of the image sensors and two or more, preferably four, polarizers form a matrix block, wherein the transmission directions of adjacent linear polarizers within a matrix block are rotated relative to one another, preferably by 45° or by 90°. In the method according to the present disclosure, the measurement signals of the image sensors that are associated with the polarizers of the same matrix block are converted into light output measured values in order to obtain the desired polarization independence.


Find Patent Forward Citations

Münchow, Frank. (2026). Measuring system and method for measuring light sources (U.S. Patent No. 12769105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769105

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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