The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Dec. 20, 2022
Mdap Co., Ltd, Chuo, JP;
Nipro Corporation, Settsu, JP;
Hidekazu Sato, Chuo, JP;
Toshikazu Hayakawa, Chuo, JP;
Yoshihiro Yoshikawa, Settsu, JP;
Hideaki Yamamoto, Settsu, JP;
Hisashi Miura, Settsu, JP;
MDAP CO., LTD., Yamanashi, JP;
NIPRO CORPORATION, Osaka, JP;
Abstract
An observation device configured to observe a sample stored in a multistage container including a plurality of spaces divided by a plurality of partition walls which are parallel. The observation device includes: a light source configured to generate light; a phase contrast microscope configured to irradiate the sample with light from the light source and to make executable observing a phase difference due to interference of light returned from the sample; and a reflection mirror configured to reflect light passed through the sample again toward the sample. The reflection mirror is inclined with respect to the plurality of partition walls of the multistage container.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile