The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 02, 2022
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Shin Utsuzawa, Sugar Land, TX (US);

Wei Chen, Houston, TX (US);

Marie Van Steene, Dhahran, SA;

Yuelin Shen, Spring, TX (US);

Albina Mutina, Clamart, FR;

Lukasz Zielinski, Arlington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); E21B 44/00 (2006.01); G01V 3/32 (2006.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); E21B 44/00 (2013.01); G01V 3/32 (2013.01); E21B 2200/20 (2020.05); E21B 2200/22 (2020.05);
Abstract

A method is provided for evaluating logging while drilling (LWD) nuclear magnetic resonance (NMR) measurement quality. The method may include rotating a bottom hole assembly (BHA) in a wellbore to drill. The BHA may include an NMR tool deployed at a first location and at least one motion sensor deployed at a second location, wherein the first and second locations are axially spaced apart in the BHA. The method may also include making NMR measurements and corresponding motion sensor measurements while drilling in the wellbore. The method may further include processing the motion sensor measurements to determine the NMR measurement quality of the corresponding NMR measurements.


Find Patent Forward Citations

Utsuzawa, Shin. (2026). Methods for estimating nmr lwd data quality (U.S. Patent No. 12769024). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12769024

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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