The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Mar. 30, 2022
Interdigital Patent Holdings, Inc., Wilmington, DE (US);
Jaya Rao, Montreal, CA;
Fumihiro Hasegawa, Westmount, CA;
Tuong Duc Hoang, Montreal, CA;
Aata El Hamss, Laval, CA;
Moon-Il Lee, Melville, NY (US);
Ghyslain Pelletier, Montreal, CA;
Paul Marinier, Brossard, CA;
InterDigital Patent Holdings, Inc., Wilmington, DE (US);
Abstract
A wireless transmit/receive unit (WTRU) and a method are described herein regarding preservation of positioning integrity associated with wireless systems. Using multiple positioning configurations and/or schemes (e.g., positioning reference signal (PRS) configurations/schemes), e.g., based on a switching pattern, may ensure integrity (e.g., adequate and/or robust integrity), for example, if error events (e.g., low reference signal received power, blockage of PRS from transmission/reception points (TRPs), etc.) have a persistent duration. The WTRU comprises a processor configured to receive a first, a second and a third subset of PRS configuration information, receive configuration information indicating error source information, a first switching pattern, and a positioning uncertainty threshold, perform a first set of measurements using the first switching pattern and the first and second subsets of PRS configuration information, determine a first positioning uncertainty based on the first set of measurements and the error source information, and send an indication indicating measurement information and positioning uncertainty information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile