The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Dec. 28, 2022
Applicant:
Nearfield Atomics Inc., Seattle, WA (US);
Inventor:
John T. Butters, Seattle, WA (US);
Assignee:
NearField Atomics Inc., Seattle, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/00 (2006.01); G01R 33/032 (2006.01); G01R 33/035 (2006.01); G01R 33/09 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0023 (2013.01); G01R 33/0094 (2013.01); G01R 33/032 (2013.01); G01R 33/0354 (2013.01); G01R 33/09 (2013.01);
Abstract
A method for identifying patterns and associated functions or structural features in molecules includes measuring an electromagnetic field of a target molecule in at least two dimensions using an array of magnetic field sensor devices; identifying at least one pattern in the measured electromagnetic fields of the target molecule and the other molecules; and associating the at least one pattern with at least one function or structural feature of the target molecule.
Butters, John. (2026). Systems and methods for measuring magnetic fields and identifying patterns in the measurements (U.S. Patent No. 12768909). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768909
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile