logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12768865 B1

PDFFull Text
Date of Patent:
Oct. 20, 2026

Filed:

Dec. 27, 2023

Electrical voltage measuring device using an microelectromechanical system and optical interferometer interaction

Applicant:

Airbus Operations, S.l.u., Getafe, ES;

Inventors:

David Vicente Oliveros, Getafe, ES;

Carlos Andres Gonzalez, Getafe, ES;

Salvador Sales Maicas, Valencia, ES;

Angel Hector Garcia Miquel, Valencia, ES;

Jorge Daniel Martinez Perez, Valencia, ES;

Assignee:

AIRBUS OPERATIONS S.L.U., Getafe, ES;

Attorney:

Greer, Burns & Crain, Ltd.

Primary Examiner:

Paresh Patel

Int. Cl.
CPC ...
G01R 15/24 (2006.01); B81B 7/02 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 15/24 (2013.01); B81B 7/02 (2013.01); G01R 19/0084 (2013.01); B81B 2201/0292 (2013.01);
Abstract

An electrical voltage values measuring device having at least one microelectromechanical device comprising a first electrode connectable to an anode of an electrical voltage source and a second electrode connectable to a cathode of the electrical voltage source, wherein the microelectromechanical device is configured to receive an electrical voltage from the electrical voltage source causing a deviation of the first electrode, associated with the electrical voltage, wherein the deviation causes a distance variation between the first electrode and the second electrode, and an optical processor that comprises a laser and an optical sensor.

Find Patent Forward Citations

Vicente Oliveros, David. (2026). Electrical voltage measuring device using an microelectromechanical system and optical interferometer interaction (U.S. Patent No. 12768865). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768865

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…