The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Feb. 10, 2022
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Satoshi Nakajima, Tokyo, JP;

Hiroyuki Mishima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 35/00732 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/0465 (2013.01);
Abstract

An automatic analyzer can be miniaturized as a whole and can accurately determine presence or absence of a sample container and a type thereof. The automatic analyzer of includes a conveyance line for conveying a loaded sample container; an identification information reading device that reads identification information attached to the sample container; and a container height detection device. The identification information reading device and the container height detection device perform reading and detection when the sample container is at a common position on the conveyance line. The container height detection device includes sensors having different height ranges for a detection target, a part of the sensors being disposed on the same side as the identification information reading device with respect to the conveyance line, and the rest of the sensors being disposed on the opposite side of the identification information reading device with respect to the conveyance line.


Find Patent Forward Citations

Nakajima, Satoshi. (2026). Automatic analyzer (U.S. Patent No. 12768853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768853

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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