The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Feb. 23, 2024
Zhejiang University, Hangzhou City, CN;
Peng Zhao, Hangzhou City, CN;
Kaipeng Ji, Hangzhou City, CN;
Hao Chen, Hangzhou City, CN;
Chaojie Zhuo, Hangzhou City, CN;
Jianzhong Fu, Hangzhou City, CN;
Zhejiang University, Hangzhou City, CN;
Abstract
The present disclosure provides a high-precision ultrasonic imaging method for an internal defect of a complex-shaped component based on a search-vector imaging condition. Based on full waveform inversion, the search-vector imaging condition is constructed, and a first-order derivative vector is combined with an approximate Hessian matrix for correction so that a high-quality image of a defect in a complex sound velocity model can be obtained. The high-precision ultrasonic imaging method is suitable for defect testing on complex surface components. The imaging condition used for the imaging method of the present disclosure does not involve an assumption on a wave field and is stricter than a traditional imaging condition theory, thereby ensuring high precision of the inventive method. Moreover, the imaging method of the present disclosure can highlight a defect in an entire measurement area, which is very convenient for locating a defect in a large-size measurement structure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile