The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Aug. 01, 2023
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Elizabeth M. C. Jones, Cedar Crest, NM (US);
Caroline Winters, Cedar Crest, NM (US);
Enrico C. Quintana, Albuquerque, NM (US);
Benjamin Roberts Halls, Albuquerque, NM (US);
Samuel Saiid Fayad, Urbana, IL (US);
Dayna Glen Obenauf, Lancaster, CA (US);
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Abstract
Digital image correlation is provided. The method comprises applying two or more unique X-ray attenuating patterns to a number of test samples and then applying physical deformation to the test samples. The test samples are irradiated concurrently with an X-ray source, and a path-integrated composite X-ray image is recorded that superimposes the unique X-ray attenuating patterns on each other. According to the path-integrated composite X-ray image, the method determines respective deformation of each of the unique X-ray attenuating patterns produced by the physical deformation of the test samples.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile