The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Oct. 31, 2019
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Takahiro Ando, Tokyo, JP;

Sakuichiro Adachi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/78 (2006.01); G01N 21/03 (2006.01); G01N 21/17 (2006.01); G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
G01N 21/78 (2013.01); G01N 21/0303 (2013.01); G01N 21/17 (2013.01); G01N 2021/0357 (2013.01); G01N 2021/1765 (2013.01); G01N 2021/755 (2013.01);
Abstract

Provided are an analyzer that analyzes a specimen with high accuracy and an analysis method for analyzing a specimen with high accuracy. The analyzer according to the present disclosure include a first reaction vessel which contains a reagent, a second reaction vessel which contains a specimen and the reagent, a detector which detects optical characteristics of the first reaction vessel and optical characteristics of the second reaction vessel, and a controller which analyzes components of the specimen in the second reaction vessel using the optical characteristics of the first reaction vessel as a baseline.


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Ando, Takahiro. (2026). Analyzer and analysis method (U.S. Patent No. 12768793). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768793

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