The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Nov. 24, 2021
Horiba, Ltd., Kyoto, JP;
Tetsuji Yamaguchi, Kyoto, JP;
HORIBA, LTD., Kyoto, JP;
Abstract
A centrifugal sedimentation-type particle size distribution measurement device that measures the particle size distribution in a measurement sample by rotating a measurement cell that contains the measurement sample and causing particles in the measurement sample to sediment, said particle size distribution measurement device comprising: a light source that irradiates the measurement cell with light; a scattered light detector that detects the intensity of scattered light caused by the particles in the measurement cell; and a particle size distribution calculation unit that measures the particle size distribution in the measurement sample on the basis of the change over time in the scattered light intensity, said change being caused by the particle sedimentation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile