The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Jun. 07, 2021
Applicant:
Ntt, Inc., Tokyo, JP;
Inventors:
Hisatoshi Kasahara, Tokyo, JP;
Yosuke Takeuchi, Tokyo, JP;
Junichiro Tamamatsu, Tokyo, JP;
Yosuke Okamura, Tokyo, JP;
Assignee:
NTT, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0041 (2013.01);
Abstract
There is provided a measurement device () including: a height difference acquisition unit () that acquires a height difference between two points on a bottom surface of a structure; and a material flexural strength calculation unit () that calculates material flexural strength of the structure based on the height difference.
Kasahara, Hisatoshi. (2026). Material flexure measuring device, system, method, and program (U.S. Patent No. 12768743). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768743
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile