The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Nov. 07, 2023
The Hong Kong University of Science and Technology, Hong Kong, CN;
The Hong Kong University of Science and Technology, Hong Kong, CN;
Abstract
A method of defect detection is provided for a pressurized pipe having an upstream node and a downstream node. The method comprises generating, by a wave source located at xat the downstream node, a transient wave travelling in a direction from the downstream node towards the upstream node, measuring, by a pressure sensor located at xupstream of the wave source, a transient response caused by the transient wave to obtain a measured signal; and processing, by a computer device to execute a time-reversal (TR) algorithm, the measured signal for determining one or more defects of the pressurized pipe.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile