The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Mar. 10, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Tadayuki Iwano, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01H 9/00 (2006.01); G01K 11/32 (2021.01);
U.S. Cl.
CPC ...
G01D 5/35358 (2013.01); G01H 9/00 (2013.01); G01K 11/32 (2013.01);
Abstract

A correction system () according to the present disclosure includes: an optical fiber sensing apparatus () configured to receive an optical signal from an optical fiber (), and acquire sensed data from the optical signal; an analysis apparatus () configured to analyze an analysis target based on the sensed data; an absolute value acquisition apparatus () configured to acquire an absolute value of the analysis target; and a correction apparatus () configured to correct an analysis result for the analysis target from the analysis apparatus (), based on the absolute value of the analysis target.


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Iwano, Tadayuki. (2026). Correction system, correction apparatus, and correction method (U.S. Patent No. 12768679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768679

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