The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Nov. 30, 2023
Lawrence Livermore National Security, Llc, Livermore, CA (US);
Ryan Douglas Muir, Livermore, CA (US);
John E. Heebner, San Ramon, CA (US);
Daniel Ernest Mittelberger, Livermore, CA (US);
Lawrence Livermore National Security, LLC, Livermore, CA (US);
Abstract
Methods, systems and devices are described that enable measurement and characterization of complex laser pulses by relying on three interferograms that are measured simultaneously. The described three-phase spectral interferometry (3PSI) can meet the growing demand for optical recorders with long record and 1 ps or finer resolution. These techniques leverage various calibration and signal retrieval operations that allow improved system performance. An example method for determining characteristics of an input optical signal includes measuring the spectra associated with three interferograms produced at outputs of a three-by-three optical splitter, and determining an amplitude and a phase value of the input optical signal using those measurements and the results of a calibration procedure that characterizes point spread functions across multiple spectrometers and determines corrections factors for the spectrometers.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile