The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Nov. 09, 2023
Applicant:

Haier Us Appliance Solutions, Inc., Wilmington, DE (US);

Inventors:

Jaewon Jo, Seongnam, KR;

Seonghoon Ryu, Suwon, KR;

Assignee:

Haier US Appliance Solutions, Inc., Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D06F 33/47 (2020.01); D06F 34/05 (2020.01); D06F 34/18 (2020.01); D06F 58/50 (2020.01); D06F 103/04 (2020.01); D06F 103/06 (2020.01); D06F 105/58 (2020.01);
U.S. Cl.
CPC ...
D06F 34/05 (2020.02); D06F 33/47 (2020.02); D06F 34/18 (2020.02); D06F 58/50 (2020.02); D06F 2103/04 (2020.02); D06F 2103/06 (2020.02); D06F 2105/58 (2020.02);
Abstract

A dryer appliance, an interconnected system of appliances, and a method for appliance diagnostics is provided. The method includes determining a washer load parameter; transmitting, from the washer appliance to the dryer appliance, the washer load parameter; determining a dryer load parameter; comparing a difference between the washer load parameter to the dryer load parameter to a difference threshold; incrementing a count when the difference between the washer load parameter to the dryer load parameter exceeds the difference threshold; and generating a fault signal if the count exceeds a count threshold.


Find Patent Forward Citations

Jo, Jaewon. (2026). System and method for appliance diagnostics (U.S. Patent No. 12768090). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768090

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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