The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Apr. 22, 2021
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Wenzhou Yan, Shanghai, CN;

Tongshuai Zhu, Shanghai, CN;

Lun Jiang, Shanghai, CN;

Hao Chen, Shanghai, CN;

Xiaodi Yu, Shanghai, CN;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 19/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); B25J 9/161 (2013.01); B25J 19/023 (2013.01);
Abstract

Methods and devices for determining a point for processing a workpiece. The methods include receiving an input representing an offset for adjusting a sample workpiece point, the sample workpiece point corresponding to a workpiece point for processing the workpiece, adjusting the sample workpiece point based on the input, so as to generate an adjusted sample workpiece point, and determining the workpiece point based on the adjusted sample workpiece point.


Find Patent Forward Citations

Yan, Wenzhou. (2026). Method and apparatus of determining point for processing workpiece (U.S. Patent No. 12766732). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12766732

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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