The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 01, 2023
Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Masato Hayashi, Kobe, JP;

Shuhei Kaneko, Kobe, JP;

Fumiaki Iwase, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01L 7/00 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502715 (2013.01); B01L 7/00 (2013.01); G01N 21/77 (2013.01); B01L 2200/04 (2013.01); B01L 2200/16 (2013.01); B01L 2300/0654 (2013.01); B01L 2300/1894 (2013.01);
Abstract

A sample measuring apparatus according to one or more embodiments may include a measuring unit that measures a sample in a container, a power supply that supplies power to the measuring unit, and an apparatus housing that accommodates the measuring unit and the power supply inside. In one or more embodiments, the power supply may be arranged in an area in the apparatus housing, the area that is the power supply is arranged is different from an area that the measuring unit is arranged in a plan view, and the power supply is arranged at a higher position than a position that the measuring unit is arranged.


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Hayashi, Masato. (2026). Sample measuring apparatus (U.S. Patent No. 12766507). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12766507

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