The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Apr. 27, 2023
Applicant:

Osstem Implant Co., Ltd., Seoul, KR;

Inventor:

Jong Moon Kim, Gunpo-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61C 13/00 (2006.01); A61B 1/00 (2006.01); A61B 1/24 (2006.01); A61B 90/00 (2016.01); A61C 1/08 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
A61C 13/0004 (2013.01); A61B 1/00009 (2013.01); A61B 1/24 (2013.01); A61C 1/084 (2013.01); G06T 7/75 (2017.01); A61B 2090/3937 (2016.02); G06T 2207/30036 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A method includes obtaining first intraoral data on the basis of imaging or scanning an oral cavity, obtaining a guide wearing simulation model for simulating a state in which a guide template model obtained on the basis of the first intraoral data is applied to the intraoral data, obtaining second intraoral data on the basis of imaging or scanning performed while a guide template corresponding to the guide template model is worn on the oral cavity, obtaining a fiducial marker wearing scan model indicating a state in which the guide template is worn on the oral cavity on the basis of the second intraoral data, and providing expected error information regarding a position of an implant model using a first fiducial marker model in which a fiducial marker is coupled to the guide wearing simulation model and a second fiducial marker model corresponding to the fiducial marker wearing scan model.


Find Patent Forward Citations

Kim, Jong. (2026). Method and device for providing expected error information related to implant placement (U.S. Patent No. 12765977). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12765977

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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