The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Nov. 15, 2024
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takuya Sakaguchi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01);
U.S. Cl.
CPC ...
A61B 6/481 (2013.01);
Abstract

According to one embodiment, an X-ray diagnostic apparatus includes an X-ray tube, an X-ray detector, and processing circuitry. The X-ray tube radiates X-rays toward a subject into which a contrast medium is injected. The an X-ray detector detects the X-rays transmitted through the subject. The processing circuitry generates an X-ray image based on an output from the X-ray detector. The processing circuitry acquires indexes related to a brightness of the X-ray image. The processing circuitry corrects, based on a reference index prior to injection of the contrast medium and a latest index after start of the injection of the contrast medium, a brightness value of the X-ray image relative to the latest index, the reference index and the latest index being included in the acquired indexes.


Find Patent Forward Citations

Sakaguchi, Takuya. (2026). X-ray diagnostic apparatus and correction method (U.S. Patent No. 12765851). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12765851

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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