The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Sep. 26, 2024
Applicant:

Boston Scientific Scimed, Inc., Maple Grove, MN (US);

Inventors:

Kian S. Lim, Shrewsbury, MA (US);

Longquan Chen, Lexington, MA (US);

Niraj Prasad Rauniyar, Plymouth, MN (US);

Assignee:

Boston Scientific Scimed, Inc., Maple Grove, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/20 (2006.01);
U.S. Cl.
CPC ...
A61B 5/201 (2013.01); A61B 5/0084 (2013.01);
Abstract

Medical systems and related methods useful to estimate the depth of a target are described. The system may include a medical device that includes a handle and a shaft, the medical device also including an imager, a processor, and at least one laser source coupled to a first laser fiber and a second laser fiber. The first and second laser fibers may be configured to transmit respective first and second collimated beams of light onto a target simultaneously without fragmenting the target. The processor may be configured to determine a depth of the target from a proximal facing surface of the target to a distal facing surface of the target based on pixel characteristics of the first and second collimated beams of light in at least one image generated by the imager.


Find Patent Forward Citations

Lim, Kian. (2026). Devices, systems, and methods for object depth estimation (U.S. Patent No. 12765822). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12765822

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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