The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Oct. 17, 2023
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Zhepeng Cong, San Jose, CA (US);

Tao Sheng, Santa Clara, CA (US);

Ashur J. Atanos, San Jose, CA (US);

Nimrod Smith, Cupertino, CA (US);

Vinh N. Tran, San Jose, CA (US);

Khokan C. Paul, Cupertino, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 72/00 (2026.01); G01J 5/02 (2022.01); G01J 5/04 (2006.01); G01J 5/0875 (2022.01); G01J 5/10 (2006.01); H10P 72/76 (2026.01);
U.S. Cl.
CPC ...
H10P 72/0602 (2026.01); G01J 5/027 (2013.01); G01J 5/0875 (2013.01); G01J 5/10 (2013.01); H10P 72/0604 (2026.01); G01J 5/046 (2013.01); G01J 2005/106 (2013.01); H10P 72/7616 (2026.01);
Abstract

The present disclosure relates to methods, systems, and apparatus for monitoring temperature at multiple sites within a substrate processing chamber. A system for processing substrates includes: a process chamber comprising a processing volume, a first window at a first perimeter of the processing volume, a substrate support within the processing volume; and a first multi-wavelength pyrometer configured to measure: a first temperature at a first site proximal the first window, and a second temperature at a second site proximal the substrate support.


Find Patent Forward Citations

Cong, Zhepeng. (2026). Multi-wavelength pyrometer for chamber monitoring (U.S. Patent No. 12765309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12765309

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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