The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jan. 17, 2023
Isteq B.v., Eindhoven, NL;
Isteq Group Holding B.v., Eindhoven, NL;
Dmitrii Igorevich Astakhov, Moscow, RU;
Samir Ellwi, Crawley, GB;
Denis Aleksandrovich Glushkov, Nieuwegein, NL;
Vladimir Vitalievich Ivanov, Moscow, RU;
Oleg Borisovich Khristoforov, Moscow, RU;
Konstantin Nikolaevich Koshelev, Moscow, RU;
Mikhail Sergeyevich Krivokorytov, Kirov, RU;
Vladimir Mikhailovich Krivtsun, Moscow, RU;
Aleksandr Andreevich Lash, Moscow, RU;
Vyacheslav Valerievich Medvedev, Moscow, RU;
Aleksandr Yurievich Vinokhodov, Moscow, RU;
ISTEQ GROUP HOLDING B.V., Eindhoven, NL;
Abstract
The invention relates to plasma source comprising a target material to produce the plasma emitting EUV radiation. The target material comprises a Li-based alloy with at least one further element selected from the group consisting of Ag, Au, Bi, Ba, Sr. The alloy is configured to increase the density of the target material by more than three times compared to the density of Li. As a result, compared with the Li target, the velocity of the droplet fraction of debris particles may be sharply reduced, which makes it possible to control the direction of its exit from the plasma due to the high velocity of the target. The plasma source is preferably a laser-produced plasma light source with a fast rotating target (at least 100 m/s). The target material may allow the creation of compact low-debris EUV light sources with high spectral brightness designed for a wide range of applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile