The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jan. 13, 2022
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Yoonoh Yang, Seoul, KR;

Sangwook Lee, Seoul, KR;

Suhwan Lim, Seoul, KR;

Jinyup Hwang, Seoul, KR;

Jinwoong Park, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01);
Abstract

There is provided a method for performing communication. The method performed by a UE and comprising: receiving measurement configuration information from a base station; and performing measurement for the plurality of cells based on the each of the multiple MG patterns, which is configured based on the MG information.


Find Patent Forward Citations

Yang, Yoonoh. (2026). Measurement based on measurement gap (U.S. Patent No. 12764577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12764577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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