The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Apr. 14, 2023
Fujifilm Business Innovation Corp., Tokyo, JP;
FUJIFILM Business Innovation Corp., Tokyo, JP;
Abstract
A printed material inspection system includes a display and a processor configured to: acquire, as a defect corresponding to a defect criterion, a difference that satisfies the defect criterion among differences between a scanned image obtained by scanning a printed material of an inspection target page among pages configuring a job and a reference image of the inspection target page; highlight the defect in the scanned image on the display and provide defect criterion display that is display for receiving setting for a defect criterion to be applied to the inspection target page on the display; and when a user operation for one of the highlighting of the defect and the providing of the defect criterion display is received, change a display mode of another one of the highlighting of the defect and the providing of the defect criterion display.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile