The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Dec. 15, 2021
Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., Munich, DE;
Johannes Greulich, Freiburg, DE;
Hannes Höffler, Freiburg, DE;
Nico Wöhrle, Freiburg, DE;
Matthias Demant, Freiburg, DE;
Abstract
A method for contactlessly assessing the quality of a solar cell includes performing a first luminescence measurement by applying excitation radiation to a first sub-region of the solar cell per first parameters and to a second sub-region (per second, different parameters. A first intensity of emitted luminescent radiation is measured in the first or second sub-region, and a second measurement measures a second intensity of luminescent radiation. In alternative A, excitation radiation is applied to the first sub-region per the first parameters and excitation radiation is applied to the second sub-region per third, different parameters. The second intensity is measured in the sub-region in which the first intensity is not measured in the first luminescence measurement. Alternative B provides applying excitation radiation homogenously to the solar cell in both sub-regions according to fourth parameters and the second intensity is measured in the first and/or second sub-region. Quality information is then determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile