The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Apr. 26, 2023
Applicants:

Constructor Technology Ag, Schaffhausen, CH;

Constructor Education and Research Genossenschaft, Schaffhausen, CH;

Inventors:

Nikita Kazeev, Singapore, SG;

Andrey Ustyuzhanin, Ferney Voltaire, FR;

Abdalaziz Rashid Al-Maeeni, Moscow, RU;

Maxim Faleev, Barcelona, ES;

Ruslan Lukin, Kazan, RU;

Alexander Tormasov, Bremen, DE;

Ignat Romanov, Beijing, CN;

Serg Bell, Singapore, SG;

Stanislav Protasov, Singapore, SG;

Nikolay Dobrovolskiy, Alanya, TR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 60/00 (2019.01); G16C 20/30 (2019.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G16C 60/00 (2019.02); G16C 20/30 (2019.02); G16C 20/70 (2019.02);
Abstract

A method for predicting at least one property of a crystal of a material, with the crystal exhibiting at least one point defect. At least one module samples structures of materials and point defects of the crystal. The method comprises: providing a neural network. The neural network comprises: receiving as input a structure of the material and an ideal crystal unit cell structure. The neural network also comprises: outputting at least one target quantity and using a generated set of data and representing the point defect. The point defect represents a set of coordinates and a type of the point defect and a crystal unit cell structure. The neural network further comprises: receiving as input at least one of a cloud of defect points and a global state vector. The neural network additionally comprises outputting a vector.


Find Patent Forward Citations

Kazeev, Nikita. (2026). Sparse representation for machine learning the properties of defects in 2d materials (U.S. Patent No. 12763174). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12763174

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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