The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jul. 19, 2024
Zhejiang Hengyi Petrochemical Co., Ltd., Hangzhou, CN;
Hangzhou Xinye Optoelectronic Engineering Co., Ltd., Hangzhou, CN;
Peng Wang, Hangzhou, CN;
Xinyi Ye, Hangzhou, CN;
Xiantao Peng, Hangzhou, CN;
Mingyi Liu, Hangzhou, CN;
Zichun Mao, Hangzhou, CN;
Luhang Zheng, Hangzhou, CN;
Zhejiang Hengyi Petrochemical Co., Ltd., Hangzhou, CN;
Hangzhou Xinye Optoelectronic Engineering Co., Ltd., Hangzhou, CN;
Abstract
Provided is a method for measuring a color difference, an electronic device and a storage medium. The method includes: conveying respective fabric segments of the fabric to be detected sequentially to a measurement port of a detection portion, so as to collect color values at a plurality of sampling points; determining a time range in which a target segment of the fabric to be detected passes through the measurement port of the detection portion; the target segment being any one fabric segment of the fabric to be detected; selecting an effective sampling point of the target segment based on the time range and sampling time points of the plurality of sampling points; and determining a corresponding color difference value of a target yarn spindle based on a color value and standard value of the effective sampling point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile