The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Oct. 11, 2023
Applicant:

Magnolia White Corporation, Tokyo, JP;

Inventors:

Satoru Tomita, Tokyo, JP;

Kazuyuki Endou, Tokyo, JP;

Kota Makishi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30108 (2013.01);
Abstract

According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a first surface side of a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image including the partition, which is generated by emitting electromagnetic waves from the first surface side of the base or a second surface side opposed to the first surface of the base, analyzing the acquired first image, and measuring an amount of protrusion at which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.


Find Patent Forward Citations

Tomita, Satoru. (2026). Measuring method including measuring an amount of protrusion protruding from a side surface of a lower portion and measuring device having the same (U.S. Patent No. 12762681). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762681

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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