The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Dec. 31, 2025
Applicant:

Uveye Ltd., Tel Aviv, IL;

Inventors:

Yonatan Moskovitz, RaAnana, IL;

Shirel Gazit, London, GB;

Roy Orfaig, Beit Hashmonai, IL;

Ilya Grinshpoun, Ramat Gan, IL;

Jonathan Sade, Ganot, IL;

Itai Orr, Or Akiva, IL;

Amir Hever, Tenafly, NJ (US);

Assignee:

UVeye Ltd., Tel Aviv, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/88 (2006.01); G06T 7/246 (2017.01); G06T 7/33 (2017.01); G06T 7/73 (2017.01); G06T 15/06 (2011.01); G06V 10/74 (2022.01); G06V 10/75 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06V 20/50 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G01N 21/8851 (2013.01); G06T 7/251 (2017.01); G06T 7/344 (2017.01); G06T 7/75 (2017.01); G06T 15/06 (2013.01); G06V 10/751 (2022.01); G06V 10/761 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G01N 2021/8887 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30244 (2013.01); G06T 2210/21 (2013.01); G06V 10/82 (2022.01); G06V 20/50 (2022.01);
Abstract

A vehicle inspection system consolidates redundant multi-view defect detections using three-dimensional spatial clustering on CAD models. The system projects two-dimensional defect detections from multiple camera viewpoints onto three-dimensional CAD model surfaces through ray-casting algorithms, then clusters projected locations based on geodesic distances to identify unique physical defects. This approach eliminates detection redundancy while providing precise spatial localization, enabling consistent defect tracking across multiple inspections regardless of vehicle positioning variations.


Find Patent Forward Citations

Moskovitz, Yonatan. (2026). Vehicle inspection system and method with three-dimensional defect clustering on cad models (U.S. Patent No. 12762677). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762677

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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