The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Sep. 10, 2024
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Akira Tanaka, Tokyo, JP;

Takashi Tameshige, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0637 (2023.01); G06Q 10/0631 (2023.01); G06Q 10/087 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/06375 (2013.01); G06Q 10/06315 (2013.01); G06Q 10/087 (2013.01);
Abstract

An object is to more correctly specify, when an abnormality occurs in a request path including a microservice, a business impacted by the abnormality of the request path. A trace data shaping unit is provided, which determines whether a redundant request path exists in a request path during a normal operation, and creates, when the redundant request path exists, trace data excluding the redundant request path. When it is determined that an abnormality occurs in any request path, a business impact range analysis unit refers to use case association information based on any request path excluding the redundant request path and specifies a content of a business impacted by the request path where the abnormality occurs among contents of businesses.


Find Patent Forward Citations

Tanaka, Akira. (2026). System and method for software path tracing and testing for microservices (U.S. Patent No. 12762496). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762496

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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