The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jan. 26, 2022
Texas Instruments Incorporated, Dallas, TX (US);
Arthur John Redfern, Dallas, TX (US);
Lijun Zhu, Plano, TX (US);
Molly Katherine Newquist, Bloomington, IN (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Techniques for a machine learning model including the steps of summing values of a set of non-binary input feature values with bias values of a first set of bias values to generate first summed values; binarizing the first summed values; receiving a set of binary weights; performing a convolution operation on the binarized summed values and the set of binary weights to generate convolved output feature values; summing feature values of the convolved output feature values with bias values of a second set of bias values and applying a scale value of a first set of scale values to generate a first set of normalized feature values; summing the first set of normalized feature values with the non-binary input feature values to generate second summed values; and outputting a set of output feature values based on the second summed normalized feature values and non-binary input feature values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile