The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jul. 08, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Beiwen Guo, Redwood City, CA (US);
Matthew T. Gerdes, Oakland, CA (US);
Guang C. Wang, San Diego, CA (US);
Hariharan Balasubramanian, Redmond, WA (US);
Kenny C. Gross, Escondido, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The disclosed embodiments relate to a system that produces anomaly-free training data to facilitate ML-based prognostic surveillance operations. During operation, the system receives a dataset comprising time-series signals obtained from a monitored system during normal, but not necessarily fault-free operation of the monitored system. Next, the system divides the dataset into subsets. The system then identifies subsets that contain anomalies by training one or more inferential models using combinations of the subsets, and using the one or more trained inferential models to detect anomalies in other target subsets of the dataset. Finally, the system removes any identified subsets from the dataset to produce anomaly-free training data.
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