The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 23, 2023
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

Joon Ho Lee, Seoul, KR;

Han Kyu Moon, Seoul, KR;

Jae Oh Woo, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/088 (2023.01); G06N 3/094 (2023.01);
U.S. Cl.
CPC ...
G06N 3/088 (2013.01); G06N 3/094 (2023.01);
Abstract

Provided are a method for evaluating performance and a system thereof. The method according to some embodiments may include obtaining a first model trained using a labeled dataset, obtaining a second model built by performing unsupervised domain adaptation on the first model, generating pseudo labels for an evaluation dataset using the second model, wherein the evaluation dataset is an unlabeled dataset, and evaluating performance of the first model using the pseudo labels.


Find Patent Forward Citations

Lee, Joon. (2026). Method for evaluating performance and system thereof (U.S. Patent No. 12762415). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762415

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…