The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Oct. 26, 2022
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Vinay Sawal, Fremont, CA (US);

Udhaya Chandran Shanmugam, Santa Clara, CA (US);

Ramya Ramachandran, Hopkinton, MA (US);

Mahendaran Pagalpatti Vijayakumar, Chennai, IN;

Ashok Kumar Janardhana, Chennai, IN;

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/27 (2020.01);
U.S. Cl.
CPC ...
G06F 30/27 (2020.01);
Abstract

Described herein are methods and a system for to optimize utilization of rack space supporting components of an existing client site rack. Real time data as to the rack space is collected, along with an objective function as to expansion. Information as to an initial design configuration is retrieved. A reinforcement learning algorithm processes real time data, the objective function, and initial design configuration to determine a deployment recommendation.


Find Patent Forward Citations

Sawal, Vinay. (2026). Method and system to determine optimal rack space utilization (U.S. Patent No. 12762307). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762307

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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