The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Mar. 18, 2025
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Jyoti Leeka, Sunnyvale, CA (US);
Vasileios Papadimos, Seattle, WA (US);
Aline Esquenazi Koritzinsky, Newcastle, WA (US);
Chandrashekhar Kadiam, Bothell, WA (US);
Wai Keat Tan, Seattle, WA (US);
MICROSOFT TECHNOLOGY LICENSING, LLC, Redmond, WA (US);
Abstract
Methods, apparatuses, and products for cardinality estimation feedback for expressions in a database query, including: calculating, for one or more expressions of a database query, a default estimated cardinality and an actual cardinality, wherein the default estimated cardinality is based on an assigned cardinality estimation (CE) model comprising a default CE model, wherein the actual cardinality is based on an execution of the database query; calculating, for the one or more expressions of the database query and based on the default estimated cardinality and the actual cardinality, a default cardinality error; selecting, for a particular expression of the one or more expressions of the database query, based on the default cardinality error for the particular expression exceeding a first threshold, a recommended CE model; and assigning the recommended CE model as the assigned CE model for the particular expression based on an improvement in one or more respective recommended cardinality errors for the particular expression relative one or more respective default cardinality errors for the particular expression exceeding a second threshold, wherein the one or more respective recommended cardinality errors for the particular expression are based on one or more recommended estimated cardinalities calculated using the recommended CE model.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile