The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Mar. 28, 2024
Applicant:

Servicenow, Inc., Santa Clara, CA (US);

Inventors:

Yair Aharon Liebkowiz, Petah Tikva, IL;

Robert Bitterfeld, Petah Tikva, IL;

Tal Ben Ari, Ness Ziyonna, IL;

Assignee:

ServiceNow, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/23 (2019.01); G06F 16/242 (2019.01); G06F 40/30 (2020.01);
U.S. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/243 (2019.01); G06F 40/30 (2020.01);
Abstract

A method including parsing, via a Large Language Model (LLM), a configuration file comprising one or more attributes associated with one or more components of a network, wherein parsing the configuration file comprises generating a probe based on the one or more attributes. The method also includes executing the probe for discovery of one or more attributes associated with the one or more components of the network and updating a resource management database based on the one or more attributes.


Find Patent Forward Citations

Liebkowiz, Yair. (2026). Systems and methods for prompt-based probe generation (U.S. Patent No. 12762105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762105

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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