The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 08, 2021
Applicant:

Vmware Llc, Palo Alto, CA (US);

Inventors:

Naira Movses Grigoryan, Yerevan, AM;

Ashot Nshan Harutyunyan, Yerevan, AM;

Arnak Poghosyan, Yerevan, AM;

Nicholas Kushmerick, Seattle, WA (US);

Janislav Jankov, San Jose, CA (US);

Assignee:

VMware LLC, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 16/28 (2019.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0709 (2013.01); G06F 11/0757 (2013.01); G06F 11/076 (2013.01); G06F 16/285 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods and systems are directed to discovering problem incidents in a distributed computing system. Events corresponding to historical problems incidents for the distributed computing system are retrieved from a data base. Sets of representative events of the various historical problem incidents for the distributed computing system are determined. A runtime problem incident in the distributed computing system is characterized by runtime events. The runtime problem incident is classified as corresponding to a historical problem incident of the historical problem incidents based on the runtime events and the sets of representative events. Remedial measures used to correct the historical problem incident may be used to correct the runtime problem.


Find Patent Forward Citations

Grigoryan, Naira. (2026). Machine learning methods and systems for discovering problem incidents in a distributed computer system (U.S. Patent No. 12762007). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762007

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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