The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Nov. 13, 2023
Applicant:

The Trustees of Columbia University IN the City of New York, New York, NY (US);

Inventors:

Elizabeth M.C. Hillman, New York, NY (US);

Wenxuan Liang, Rushan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 3/00 (2006.01); G02B 21/33 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G02B 3/0087 (2013.01); G02B 21/0048 (2013.01); G02B 21/33 (2013.01); G02B 21/361 (2013.01);
Abstract

This application describes Swept, Confocally-Aligned Planar Excitation (SCAPE) microscopy systems that incorporate a gradient index (GRIN) lens to relay images from their distal tip to their proximal tip so that 3D images of deep tissue can be captured, without undue loss of light. A zero working distance feature can be designed into the third objective to ensure that the light that exits the second objective in the SCAPE system is not lost. Alternatively, a tapered fiber bundle may be positioned between the second objective and the third objective in the SCAPE system to ensure that the light that exits the second objective is not lost. As yet another alternative, direct detection at the intermediate image plane without using a third objective can ensure that the light that exits the second objective in the SCAPE system is not lost.


Find Patent Forward Citations

Hillman, Elizabeth M.C.. (2026). Swept, confocally-aligned, planar excitation (scape) microscopy using a graded-index (grin) lens (U.S. Patent No. 12761456). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761456

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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