The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 13, 2023
Applicant:

Delta Electronics, Inc., Taoyuan City, TW;

Inventors:

Min Hsu, Taoyuan City, TW;

Shih-Ying Hsu, Taoyuan City, TW;

Assignee:

DELTA ELECTRONICS, INC., Taoyuan City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/06 (2006.01); G01S 7/481 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01S 17/06 (2013.01); G01S 7/4814 (2013.01); G01S 7/497 (2013.01);
Abstract

A measurement method for measuring a position and a tilt angle of a target object includes the following steps. A pixel deviation between a first pixel and a second pixel of the target object is calculated. The pixel deviation is substituted into a curve of tilt angle versus pixel deviation to obtain the tilt angle of the target object. A first target curve and a second target curve are selected according to the first pixel, the second pixel and the tilt angle. A zero-tilt angle is substituted into the first target curve and the second target curve, respectively, to obtain a pixel at the zero-tilt angle. The pixel at the zero-tilt angle is substituted into a position curve to obtain the position of the target object.


Find Patent Forward Citations

Hsu, Min. (2026). Measurement method and non-contact displacement detection apparatus thereof (U.S. Patent No. 12761353). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761353

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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