Multiple-range calibration for per-pin parametric measurement unit

Abstract

A test equipment system can provide signals to, or receive signals from, a device under test (DUT). The test system can include an output stage with output buffer circuitry that can be locally or externally controlled. An external controller can be used to provide precision input signals and, in response, measure current at a DUT interface node of the system, or measure voltage characteristics of various components inside the system. Using the input signals from the external controller, one or more aspects of the test system can be calibrated. For example, resistances of sense resistors in the output stage can be calibrated using current signals received from the external controller. In another example, buffer offset characteristics can be determined using signals from the external controller to control local drive circuitry of the system.