The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 13, 2024
Applicant:

Wuhan United Imaging Life Science Instrument Co., Ltd., Wuhan, CN;

Inventors:

Jianfan Zhou, Shanghai, CN;

Bin Xing, Wuhan, CN;

Hongxia Lei, Wuhan, CN;

Renkuan Zhai, Wuhan, CN;

Yao Xing, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/56 (2006.01); G01R 33/565 (2006.01); G01R 33/58 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56572 (2013.01); G01R 33/5608 (2013.01); G01R 33/58 (2013.01);
Abstract

Embodiments of the present disclosure provide methods and systems for gradient sensitivity correction. The method may include obtaining a three-dimensional image of a phantom. The three-dimensional image may be acquired using an MRI device, and the phantom may have a known actual size on a target axis. The method may include determining a fitting size of the phantom on the target axis by fitting the three-dimensional image. The method may further include correcting, based on the fitting size and the actual size, a gradient sensitivity of the MRI device.


Find Patent Forward Citations

Zhou, Jianfan. (2026). Methods and systems for gradient sensitivity correction (U.S. Patent No. 12761307). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761307

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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