The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

May. 15, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Thorsten Feiweier, Poxdorf, DE;

Mario Zeller, Erlangen, DE;

Adam Kettinger, Erlangen, DE;

Michael Köhler, Nuremberg, DE;

Max Müller, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/483 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5616 (2013.01); G01R 33/4835 (2013.01); G01R 33/5611 (2013.01); G01R 33/56554 (2013.01);
Abstract

Method for separating measurement data of an examination object, which data was acquired in collapsed form simultaneously for slices using an EPI SMS technique, into measurement data of individual slices, first and second sets of reference measurement data for separating the measurement data are acquired for each of the slices using a GRE acquisition technique, wherein the reference measurement data in the first set is acquired during switching of readout gradients of a first polarity, and the reference measurement data in the second set is acquired during switching of readout gradients of a second polarity. Based on the two sets of reference measurement data, corresponding separate first calibration data is determined from the reference measurement data acquired using a GRE acquisition technique while switching readout gradients of a first polarity, and second calibration data is determined from the reference measurement data acquired while switching readout gradients of a second polarity.


Find Patent Forward Citations

Feiweier, Thorsten. (2026). Echo planar slice multiplexing (U.S. Patent No. 12761305). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761305

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…